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Symposium Schedule

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2018 Symposium Program (pdf)

SUNDAY, SEPTEMBER 23, 2018

Registration
7:30 a.m. - 5:00 p.m.

S20.20
8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20) (PrM) (Day 1)

Tutorials
8:00 a.m. - 12:00 p.m. DD110: ESD Basics to Advanced Protection Design (DD)

8:00 a.m. - 5:00 p.m. FC100: ESD Basics for the Program Manager (PrM)

8:30 a.m. - 12:00 p.m. DD200: Charged Device Model Phenomena, Design, and Modeling (DD)

8:30 a.m. - 12:00 p.m. FC165: Novel Methods for Fixing ESD Issues in the Factory for both Electronics & Explosive Products

8:30 a.m. - 12:00 p.m. DD/FC130: System Level ESD/EMI: Testing to IEC & Other Standards (PrM), (DD)

8:30 a.m. - 12:00 a.m. FC200: Packaging Principles for the Program Manager (PrM)

1:00 a.m. - 4:30 p.m. DD311: Impact of Technology Scaling on Components High Current Phenomena and Implications for Robust ESD Design (DD)

1:00 p.m. - 4:30 p.m. DD201: ESD Protection and I/O Design

1:00 p.m. - 4:30 p.m. DD204: ESD Design in HV Technologies

1:00 p.m. - 4:30 p.m. FC365: Practical Applications of Ionization

1:00 p.m. - 4:30 p.m. FC370: Basics of EMI and EOS in Manufacturing Environment and First Mitigation

MONDAY, SEPTEMBER 24, 2018

Registration
7:30 a.m. - 5:00 p.m.

S20.20
8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20) (PrM) (Day 2)

Tutorials
8:30 a.m. - 4:30 p.m. FC101: How To’s of In-Plant ESD Auditing and Evaluation Measurements (PrM)

8:30 a.m. - 12:00 p.m. DD100: ESD Circuits

8:30 a.m. - 12:00 p.m. DD231: ESD System Level: Physics, Testing, Debugging of Soft and Hard Failures

8:30 a.m. - 12:00 p.m. FC120: Air Ionization Issues and Answers for the Program Manager (PrM)

8:30 a.m. - 12:00 p.m. DD/FC250: What Information Needs to be Exchanged for Potential EOS Problem

8:30 a.m. - 10:00 a.m. DD115: Latch-Up Basics and Testing

10:30 a.m. - 12:00 p.m. DD117: TCAD Fundamentals

1:00 a.m. - 4:30 p.m. DD300: Circuit-Level Modeling and Simulation of On-Chip Protection (DD) REVISED

1:00 p.m. - 4:30 p.m. DD340: Integrated ESD Device and Board Level Design

1:00 p.m. - 4:30 p.m. FC215: Device Technology and Failure Analysis Overview (PrM)

1:00 p.m. - 2:30 p.m. DD/FC330: Control of Charged Board Event (CBE)

1:00 p.m. - 2:30 p.m. DD317: ESD Challenges in Advanced FinFET and GAA NW CMOS Technologies

3:00 p.m. - 4:30 p.m. FC201: ESD - A Surprisingly Frequent Root Cause of Device Failure

Emerging topic
3:00 p.m. - 4:30 p.m. Technology and ESD Challenges Towards 7 nm

Reception
5:00 p.m. - 6:00 p.m. Professional and Technical Women’s Reception

Welcome Reception - Exhibits Open
6:00 p.m. - 9:00 p.m.

TUESDAY, SEPTEMBER 25, 2018

Registration
7:30 a.m. - 5:00 p.m.

Awards Breakfast
7:30 a.m. - 9:45 a.m. Annual Meeting and Awards Breakfast

Keynote
9:00 a.m. - 9:45 a.m. Electrified Automobility - Protecting Driver and Electronics Dr. Hans Stork

Exhibits Open
9:30 a.m. - 5:30 p.m.

Technical Sessions
10:00 a.m.-10:10 a.m. Exhibitor Showcase in Session 1A and 1B

10:10 a.m.-12:15 p.m. 1A: Advanced CMOS

10:10 a.m.-12:15 p.m. 1B: Manufacturing I

1:25 p.m. - 2:45 p.m.   Hands-On Session I Manufacturing Track
                                    Process Assessment Measurements

1:25 p.m. - 1:35 p.m. Exhibitor Showcase in Sessions 2A and 2B

1:35 p.m. - 2:50 p.m. 2A: System Level ESD l

1:35 p.m. - 2:50 p.m. 2B: RF / High Voltage & MEMS I

3:20 p.m. - 3:30 p.m. Exhibitor Showcase in Sessions 3A and 3B

3:30 p.m. - 4:45 p.m. 3A: System Level Modelling

3:30 p.m. - 4:45 p.m. 3B: RF & High Voltage & MEMS ll

3:25 p.m. - 4:45 p.m. Invited Speaker Session Manufacturing

3:25 p.m. - 4:05 p.m. I: ESD in Health Care

4:05 p.m. - 4:45 p.m. II: How to Achieve Return on Investment in ESD Control

Study Session
5:00 p.m. - 6:00 p.m. Calculations and ESD Scenarios Review for ESD Program Manager Exam Preparation (STUDY SESSION)

Workshops A
5:05 p.m. - 6:20 p.m.

A.1 Industry Council’s Next Thresholds Targets - Do We Need Lower Targets, and Can We Achieve Them?
A.2 EDA Solutions for ESD System Level
A.3 Latch-up Testing - JESD78F and Beyond
A.4 Process Assessment of Automated Handlers

WEDNESDAY, SEPTEMBER 26, 2018

Invited Breakfast
7:00 a.m. - 8:00 a.m. University Students/Professors Invited to Breakfast with ESDA Management

Registration
7:30 a.m. - 5:00 p.m.

Exhibits Open
8:30 a.m. - 1:30 p.m.

Technical Sessions
8:00 a.m. - 8:40 a.m. Year in Review: EOS in Automotive

8:50 a.m. - 9:00 a.m. Exhibitor Showcase in Session 4A & 4B

9:00 a.m. - 10:40 a.m. 4A: System Level Soft Failures

9:00 a.m. - 11:05 a.m. 4B: Manufacturing II

1:00 p.m. - 1:30 p.m. Welcome to the IoT Workshop

1:30 p.m. - 5:00 p.m. IoT Workshop Session A

1:30 p.m. - 2:15 p.m. A1: IoT Technologies for the Developing Countries: Oprotunities & Challenges

2:15 p.m. - 3:00 p.m. A2: Cognitive Control of Building HVAC Systems -- Challenges and Lessons Learned

3:15 p.m. - 4:00 p.m. A3: IoT Challenges Through Three Examples

4:00 p.m. - 4:45 p.m. A4: If You Lower Your Shields - System Level Implications of Losing Layers of Surge Protection in Safety-Critical IoT

1:25 p.m. - 3:25 p.m. Hands On Session II Manufacturing Track

1:25 p.m. - 1:35 p.m. II.A ESD Body Walking Voltage Measurement Demonstration

1:35 p.m. - 2:45 p.m. II.B Hand Tools and Soldering Irons - Qualification and Compliance Verification

1:45 p.m. - 2:25 p.m. ll.A, ll.B Demo Session

2:25 p.m. - 2:35 p.m. II.C Ionizer Compliance Verification Process

2:35 p.m. - 2:45 p.m. II.D Package Characterization

2:45 p.m. - 3:25 p.m. ll.C, ll.D Demo Session

1:35 p.m. - 3:15 p.m. 5A: System Level ESD ll

1:35 p.m. - 3:15 p.m. 5B: EOS/ESD EDA Tools

1:25 p.m. - 3:15 p.m. 6A: Testing

3:45 p.m. - 5:25 p.m. 7A: ESD Transient Analysis

3:40 p.m. - 5:25 p.m. Tutorial Session I: Manufacturing Track

I.A Meet ESD TR23-01-18
I.B Updates on ESD Manufacturing and ESD Control Standards
I.C Troubleshooting of ESD Issue in Manufacturing Floor

Workshops B
5:45 p.m. - 7:00 p.m.

B.1 Can Everyone Agree on what AMR Means
B.2 System Level Testing (CDE, CBE, HMM,) - What Does Industry Really Need?
B.3 Qualification of Packaging Material - Use of Packages Outside of an EPA
B.4 IoT Workshop - What is Different in Regards to Robustness Requirements in a connected World of IoT Devices

Reception
7:00 p.m. - 9:00 p.m. General Chair’s Reception Open to all Symposium Attendees!

THURSDAY, SEPTEMBER 27, 2018

Registration
7:30 a.m. - 5:00 p.m.

Technical Sessions
8:00 a.m. - 8:40 a.m. Year in Review: System Level ESD

8:50 a.m. - 10:20 a.m. Discussion Group Session Manufacturing Track

DG.A EOS/ESD Control Program Concerns and Solutions

DG.B ESD Best Practices when Handling Explosives and Energetic Components

DG.C System Level ESD Simulations

8:50 a.m. - 10:30 a.m. 8A: Numerical Modeling

9:00 a.m. - 12:30 p.m. IoT Workshop Session B

9:00 a.m. - 9:45 a.m. B1: Building a Robust and Secured IoT Edge Device with Advanced Semiconductor Technology

9:45 a.m. - 10:30 a.m. B2: Improving the System Integration of Future IoT Devices Using Simulations: Design Approaches and Challenges

10:45 a.m. - 11:30 a.m. B3: Heterogeneous Integrated Edge Device Design: Pave the Road to Robust IoT System

11:30 a.m. - 12:15 p.m. B4: Convergence of Electromagnetic Engineering in Systems

10:50 a.m. - 12:05 a.m. 9A: ESD Test Cases

10:40 a.m. - 12:25 p.m. Tutorial Session II Manufacturing Track

II.A Suspect Counterfeit ESD Packaging and Materials have Infiltrated the Comercial & DOD Supply Chain
II.B Limitiations of Test Equipment and Understanding Measurement Results
II.C Common ESD Problems in Manufacturing

1:30 p.m. - 3:45 p.m. IoT Workshop Session C&D

C1: Is 1kV Also Enough for IoT ESD Protection - Do Current Test Methods and Models Apply?
D1: How Amazon Builds Robust Consumer and Smart Home Products?
D2: ESD Robustness of IoT Devices: Are We Going to Face New Challenges?

4:00 p.m. - 4:45 p. m. IoT Workshop Panel Discussion

4:45 p.m. - 5:00 p.m. IoT Workshop Closing

Social Hour
12:30 p.m. - 1:30 p.m. First Time Attendee Social Hour

THURSDAY, SEPTEMBER 27, 2018 (CONTINUED)

Tutorials
8:00 a.m. - 4:30 p.m. FC170: ANSI/ESD S20.20 ESD Program Assessment for Internal Auditors and Supplier Quality Engineers

8:30 a.m. - 12:00 p.m. DD260: Design for EOS Reliability

8:30 a.m. - 12:00 p.m. DD150: Introduction for RF ESD Design

8:30 a.m. - 12:00 p.m. FC110: Cleanroom Considerations for the Program Manager (PrM)

8:30 a.m. - 12:00 p.m. FC361: ESD Controls for CDM and Ultra-Sensitive Devices and Circuit Boards

8:30 a.m. - 10:00 a.m. DD/FC165: Design Engineer - Weak Link or Warrior in the ESD Battle

10:30 a.m. - 12:00 p.m. DD213: ESD, EOS, and Latch-up Failure Analysis for Designers

1:00 p.m. - 4:30 p.m. DD220: Transmission Line Pulse (TLP) Basics and Applications (DD)

1:00 p.m. - 4:30 p.m. FC262: Electrical Fields and Particles - Practical Considerations for the Factory

1:00 p.m. - 4:30 p.m. FC150: Hands-on ESD Measurements & Instruments - Uses and Pitfalls

1:00 p.m. - 4:30 p.m. FC360: Electrical Overstress (EOS) in Manufacturing and Test

1:00 p.m. - 2:30 p.m. DD381: Electronic Design Automation (EDA) Solutions for ESD

3:00 p.m. - 4:30 p.m. DD382: Electronic Design Automation (EDA) Solutions for Latch-up

FRIDAY, SEPTEMBER 28, 2018

8:00 a.m. - 5:00 p.m. Device Design Certification Exam

8:00 a.m. - 5:00 p.m. Program Manager Certification Exam

SUNDAY, SEPTEMBER 23, 2018

Registration
7:30 a.m. - 5:00 p.m.

S20.20
8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20) (PrM) (Day 1)

Tutorials
8:00 a.m. - 12:00 p.m. DD110: ESD Basics to Advanced Protection Design (DD)

8:00 a.m. - 5:00 p.m. FC100: ESD Basics for the Program Manager (PrM)

8:30 a.m. - 12:00 p.m. DD200: Charged Device Model Phenomena, Design, and Modeling (DD)

8:30 a.m. - 12:00 p.m. FC165: Novel Methods for Fixing ESD Issues in the Factory for both Electronics & Explosive Products

8:30 a.m. - 12:00 p.m. DD/FC130: System Level ESD/EMI: Testing to IEC & Other Standards (PrM), (DD)

8:30 a.m. - 12:00 a.m. FC200: Packaging Principles for the Program Manager (PrM)

1:00 a.m. - 4:30 p.m. DD311: Impact of Technology Scaling on Components High Current Phenomena and Implications for Robust ESD Design (DD)

1:00 p.m. - 4:30 p.m. DD201: ESD Protection and I/O Design

1:00 p.m. - 4:30 p.m. DD204: ESD Design in HV Technologies

1:00 p.m. - 4:30 p.m. FC365: Practical Applications of Ionization

1:00 p.m. - 4:30 p.m. FC370: Basics of EMI and EOS in Manufacturing Environment and First Mitigation

MONDAY, SEPTEMBER 24, 2018

Registration
7:30 a.m. - 5:00 p.m.

S20.20
8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20) (PrM) (Day 2)

Tutorials
 8:30 a.m. - 4:30 p.m. FC101: How To’s of In-Plant ESD Auditing and Evaluation Measurements (PrM)

8:30 a.m. - 12:00 p.m. DD100: ESD Circuits

8:30 a.m. - 12:00 p.m. DD231: ESD System Level: Physics, Testing, Debugging of Soft and Hard Failures

8:30 a.m. - 12:00 p.m. FC120: Air Ionization Issues and Answers for the Program Manager (PrM)

8:30 a.m. - 12:00 p.m. DD/FC250: What Information Needs to be Exchanged for Potential EOS Problem

8:30 a.m. - 10:00 a.m. DD115: Latch-Up Basics and Testing

10:30 a.m. - 12:00 p.m. DD117: TCAD Fundamentals

1:00 a.m. - 4:30 p.m. DD300: Circuit-Level Modeling and Simulation of On-Chip Protection (DD) REVISED

1:00 p.m. - 4:30 p.m. DD340: Integrated ESD Device and Board Level Design

1:00 p.m. - 4:30 p.m. FC215: Device Technology and Failure Analysis Overview (PrM)

1:00 p.m. - 2:30 p.m. DD/FC330: Control of Charged Board Event (CBE)

1:00 p.m. - 2:30 p.m. DD317: ESD Challenges in Advanced FinFET and GAA NW CMOS Technologies

3:00 p.m. - 4:30 p.m. FC201: ESD - A Surprisingly Frequent Root Cause of Device Failure

Emerging topic
3:00 p.m. - 4:30 p.m. Technology and ESD Challenges Towards 7 nm

Reception
5:00 p.m. - 6:00 p.m. Professional and Technical Women’s Reception

Welcome Reception - Exhibits Open
6:00 p.m. - 9:00 p.m.

TUESDAY, SEPTEMBER 25, 2018

Registration
7:30 a.m. - 5:00 p.m.

Awards Breakfast
7:30 a.m. - 9:45 a.m. Annual Meeting and Awards Breakfast

Keynote
9:00 a.m. - 9:45 a.m. Electrified Automobility - Protecting Driver and Electronics Dr. Hans Stork

Exhibits Open
9:30 a.m. - 5:30 p.m.

Technical Sessions
10:00 a.m.-10:10 a.m. Exhibitor Showcase in Session 1A and 1B

10:10 a.m.-12:15 p.m. 1A: Advanced CMOS

10:10 a.m.-12:15 p.m. 1B: Manufacturing I

1:25 p.m. - 2:45 p.m.   Hands On Session I Manufacturing Track

     Process Assessment Measurements

1:25 p.m. - 1:35 p.m. Exhibitor Showcase in Sessions 2A and 2B

1:35 p.m. - 2:50 p.m. 2A: System Level ESD l

1:35 p.m. - 2:50 p.m. 2B: RF / High Voltage & MEMS I

3:20 p.m. - 3:30 p.m. Exhibitor Showcase in Sessions 3A and 3B

3:30 p.m. - 4:45 p.m. 3A: System Level Modelling

3:30 p.m. - 4:45 p.m. 3B: RF & High Voltage & MEMS ll

3:25 p.m. - 4:45 p.m. Invited Speaker Session Manufacturing

3:25 p.m. - 4:05 p.m.I: ESD in Health Care

4:05 p.m. - 4:45 p.m. II: How to Achieve Return on Investment in ESD Control

Study Session
5:00 p.m. - 6:00 p.m. Calculations and ESD Scenarios Review for ESD Program Manager Exam Preparation
(STUDY SESSION)

Workshops A
5:05 p.m. - 6:20 p.m.
A.1 Industry Council’s Next Thresholds Targets - Do We Need Lower Targets, and Can We Achieve Them?

A.2 EDA Solutions for ESD System Level

A.3 Latch-up Testing - JESD78F and Beyond

A.4 Process Assessment of Automated Handlers

WEDNESDAY, SEPTEMBER 26, 2018

Invited Breakfast
7:00 a.m. - 8:00 a.m. University Students/Professors Invited to Breakfast with ESDA Management

Registration
7:30 a.m. - 5:00 p.m.

Exhibits Open
8:30 a.m. - 1:30 p.m.

Technical Sessions
8:00 a.m. - 8:40 a.m. Year in Review: EOS in Automotive

8:50 a.m. - 9:00 a.m. Exhibitor Showcase in Session 4A & 4B

9:00 a.m. - 10:40 a.m. 4A: System Level Soft Failures

9:00 a.m. - 11:05 a.m. 4B: Manufacturing II

1:00 p.m. - 1:30 p.m. Welcome to the IoT Workshop

1:30 p.m. - 5:00 p.m. IoT Workshop Session A

1:30 p.m. - 2:15 p.m. A1: IoT Technologies for the Developing Countries: Oprotunities & Challenges

2:15 p.m. - 3:00 p.m.A2: Cognitive Control of Building HVAC Systems -- Challenges and Lessons Learned

3:15 p.m. - 4:00 p.m. A3: IoT Challenges Through Three Examples

4:00 p.m. - 4:45 p.m.A4: If You Lower Your Shields - System Level Implications of Losing Layers of Surge Protection in Safety-Critical IoT

1:25 p.m. - 3:25 p.m. Hands On Session II Manufacturing Track

1:25 p.m. - 1:35 p.m.II.A ESD Body Walking Voltage Measurement Demonstration
1:35 p.m. - 2:45 p.m. II.B Hand Tools and Soldering Irons - Qualification and Compliance Verification

1:45 p.m. - 2:25 p.m. ll.A, ll.B Demo Session
2:25 p.m. - 2:35 p.m.II.C Ionizer Compliance Verification Process
2:35 p.m. - 2:45 p.m. II.D Package Characterization
2:45 p.m. - 3:25 p.m. ll.C, ll.D Demo Session

1:35 p.m. - 3:15 p.m. 5A: System Level ESD ll

1:35 p.m. - 3:15 p.m. 5B: EOS/ESD EDA Tools

1:25 p.m. - 3:15 p.m. 6A: Testing

3:45 p.m. - 5:25 p.m. 7A: ESD Transient Analysis

3:40 p.m. - 5:25 p.m. Tutorial Session I: Manufacturing Track

I.A Meet ESD TR23-01-18
I.B Updates on ESD Manufacturing and ESD Control Standards
I.C Troubleshooting of ESD Issue in Manufacturing Floor

Workshops B
5:45 p.m. - 7:00 p.m.
B.1 Can Everyone Agree on what AMR Means

B.2 System Level Testing (CDE, CBE, HMM,) - What Does Industry Really Need?
B.3 Qualification of Packaging Material - Use of Packages Outside of an EPA

B.4 IoT Workshop - What is Different in Regards to Robustness Requirements in a connected World of IoT Devices

Reception
7:00 p.m. - 9:00 p.m. General Chair’s Reception
Open to all Symposium Attendees!

THURSDAY, SEPTEMBER 27, 2018

Registration
7:30 a.m. - 5:00 p.m.

Technical Sessions
8:00 a.m. - 8:40 a.m. Year in Review: System Level ESD

8:50 a.m. - 10:20 a.m. Discussion Group Session Manufacturing Track

DG.A EOS/ESD Control Program Concerns and Solutions

DG.B ESD Best Practices when Handling Explosives and Energetic Components

DG.C System Level ESD Simulations

8:50 a.m. - 10:30 a.m. 8A: Numerical Modeling

9:00 a.m. - 12:30 p.m. IoT Workshop Session B

9:00 a.m. - 9:45 a.m. B1: Building a Robust and Secured IoT Edge Device with Advanced Semiconductor Technology

9:45 a.m. - 10:30 a.m. B2: Improving the System Integration of Future IoT Devices Using Simulations: Design Approaches and Challenges

10:45 a.m. - 11:30 a.m. B3: Heterogeneous Integrated Edge Device Design: Pave the Road to Robust IoT System

11:30 a.m. - 12:15 p.m. B4: Convergence of Electromagnetic Engineering in Systems

10:50 a.m. - 12:05 a.m. 9A: ESD Test Cases

10:40 a.m. - 12:25 p.m. Tutorial Session II Manufacturing Track

II.A Suspect Counterfeit ESD Packaging and Materials have Infiltrated the Comercial & DOD Supply Chain

II.B Limitiations of Test Equipment and Understanding Measurement Results
II.C Common ESD Problems in Manufacturing

1:30 p.m. - 3:45 p.m. IoT Workshop Session C&D

          C1: Is 1kV Also Enough for IoT ESD Protection - Do Current Test Methods and Models Apply?

          D1: How Amazon Builds Robust Consumer and Smart Home Products?

          D2: ESD Robustness of IoT Devices: Are We Going to Face New Challenges?

4:00 p.m. - 4:45 p. m. IoT Workshop Panel Discussion

4:45 p.m. - 5:00 p.m. IoT Workshop Closing

Social Hour
12:30 p.m. - 1:30 p.m. First Time Attendee Social Hour

THURSDAY, SEPTEMBER 27, 2018 (CONTINUED)

Tutorials
8:00 a.m. - 4:30 p.m. FC170: ANSI/ESD S20.20 ESD Program Assessment for Internal Auditors and Supplier Quality Engineers

8:30 a.m. - 12:00 p.m. DD260: Design for EOS Reliability

8:30 a.m. - 12:00 p.m. DD150: Introduction for RF ESD Design

8:30 a.m. - 12:00 p.m. FC110: Cleanroom Considerations for the Program Manager (PrM)

8:30 a.m. - 12:00 p.m. FC361: ESD Controls for CDM and Ultra-Sensitive Devices and Circuit Boards

8:30 a.m. - 10:00 a.m. DD/FC165: Design Engineer - Weak Link or Warrior in the ESD Battle

10:30 a.m. - 12:00 p.m. DD213: ESD, EOS, and Latch-up Failure Analysis for Designers

1:00 p.m. - 4:30 p.m. DD220: Transmission Line Pulse (TLP) Basics and Applications (DD)

1:00 p.m. - 4:30 p.m. FC262: Electrical Fields and Particles - Practical Considerations for the Factory

1:00 p.m. - 4:30 p.m. FC150: Hands-on ESD Measurements & Instruments - Uses and Pitfalls

1:00 p.m. - 4:30 p.m. FC360: Electrical Overstress (EOS) in Manufacturing and Test

1:00 p.m. - 2:30 p.m. DD381: Electronic Design Automation (EDA) Solutions for ESD

3:00 p.m. - 4:30 p.m. DD382: Electronic Design Automation (EDA) Solutions for Latch-up

FRIDAY, SEPTEMBER 28, 2018

8:00 a.m. - 5:00 p.m. Device Design Certification Exam

8:00 a.m. - 5:00 p.m. Program Manager Certification Exam