Essentials for ESD Programs
Factory: Technologies • Controls • Procedures
This Seminar offers a broad exposure to the essentials of ESD control systems and programs. It offers a two-day comprehensive set of factory technologies and procedures designed for managers, technicians, and specialists desiring ESD control program training and information. The key concepts and information from the courses listed have been selected for this two-day seminar. Demonstrations and videos are included in this seminar. Examples of electrostatics and ESD calculations are included where appropriate throughout the seminar.
- ESD Basics for the Program Manager
- Ionization and Answers for the Program Manager
- Packaging Principles for the Program Manager
- System Level ESD/EMI: Testing to IEC and Other Standards
- Cleanroom Considerations for the Program Manager
- How To's of In-Plant ESD Survey and Evaluation Measurements
- Device Technology and Failure Analysis Overview
- Electrostatic Calculations for the Program Manager and the
- ESD Engineer
- ESD Standards Overview for the Program Manager
- ESD Program Development & Assessment (ANSI/ESD S20.20 Seminar)
This section reviews the fundamentals of electrostatics, charge flow, electric field and voltage. The concept of capacitance and the fundamental relationship, Q = CV, is introduced and explored with demonstrations and videos. The practical application of these concepts to the measurement of resistance, fields and voltages, and the relevant standards are reviewed and demonstrated.
The principles from Part I are then applied to grounding principles and standards, measurement of charge, standard models for ESD (i.e., human-body model and charged device model), and static induction with demonstrations and videos. Very simple and basic ESD protection circuit concepts and relevant failure analysis techniques are introduced and reviewed.
Key ESD technical areas are reviewed such as air ionization, ESD-safe packaging, cleanroom principles and electrostatic attraction. Standards relevant to these areas are described.
The final section includes charge generation test methods, additional ESDA standards, system-level ESD standards and testing, practical auditing techniques and strategies, and ESD event detection. The tutorial concludes with a review of ESD Protected-Areas (EPAs), ESD Program Management and the application of ANSI/ESD S20.20.
This two-day seminar consists of concentrated versions of the ten ESDA tutorials which comprise the ESDA Program Manager (PrM) Certification Program. This course can serve as a refresher class to those taking the PrM Certification exam. More information on certification is available
ESD Device Design Essentials
This Seminar offers a broad exposure to the essentials of ESD device design programs. It offers a two-day comprehensive set of device technologies and procedures designed for managers, technicians, and specialists desiring ESD device design training and information. This two-day seminar consists of concentrated versions of twelve ESDA tutorials which comprise the ESDA Device Design Certification Program.
- ESD On-Chip Protection in Advanced Technologies
- SPICE-Based ESD Protection Design Utilizing Diodes and Active MOSFET Rail Clamp Circuits
- EOS/ESD Failure Models and Mechanisms
- On-Chip ESD Protection in RF Technologies
- Charged Device Model Phenomena and Design
- Latch-up Physics and Design
- Circuit Modeling and Simulation for On-Chip Protection
- Troubleshooting On-Chip ESD Failures
- Device Testing--IC Component Level: HBM, CDM, MM, and TLP
- Impact of Technology Scaling on ESD High Current Phenomena and Implications for Robust ESD Design
- Transmission Line Pulse Measurements: Parametric Analyzer for ESD On-Chip Protection
- System Level ESD/EMI: Testing to IEC and other Standards
This part reviews the fundamentals of ESD testing, high-current physics, and ESD modeling. The focus is on device-level (HBM, CDM, MM, TLP) and system level testing, impact of technology scaling on ESD high current phenomena, as well as circuit modeling and simulation for on-chip protection
The principles from part I are then applied to ESD Protection Design. This part describes ESD on-chip protection in advanced technologies, SPICE-based ESD protection design utilizing diodes and active MOSFET rail clamp circuits, etc.
This part describes special ESD design cases, including Charged Device Model (CDM) phenomena and design, on-chip ESD protection in RF Technologies, and latch-up physics and design
The final section discusses EOS/ESD failure models and mechanisms. The seminar concludes with practical examples for troubleshooting of on-chip ESD failures.
More information on certification is available https://www.esda.org/certification/esda-professional-device-design/