MayJune 2005

THRESHOLD The ESD Association newslet- ter, for everyone with an interest in the understanding and control of electrostatic discharge. ™ News bits Volume 21, No. 3 May/June 2005 Customize your symposium experience Continued on page 4 The EOS/ESD Sympo- sium continues to be the best source for ESD in- formation and solutions. Attendees can custom- ize their Symposium ex- perience to concentrate on their specific areas of interest. To help plan your participation, sympo- sium is programmed along three techni- cal tracks: 1. ESD Test, Failure Analysis, and Systems; 2. Factory, Materials, and ESD Control; and 3. Device, Design, and Technology. Select your area of interest and use the track designations to help fill your symposium experience with courses best suited to your area. These tracks serve as guidelines only—you may attend any event or session you wish. Technical Tracks Track 1 ESD Test, Failure Analysis, and Systems (TFAS) If you need to understand failure models, troubleshoot ESD failures, test for or evaluate component ESD susceptibility, or develop systems or protection schemes, you will find the following tuto- rials, technical sessions and workshops of special interest: Tutorials Sunday • System Level ESD/EMI (Part 1 & 2) Monday • EOS/ESD Failure Models and Mechanisms • Device Testing - Component Level Education schedule The education schedule now includes this year’s EOS/ESD Symposium courses. See page 5 for more information. Symposium 4 months away The EOS/ESD Symposium continues to take shape as we move into the final stages of preparation and organization. See page 8 for a summary of this year’s symposium schedule. Thursday • Troubleshooting On- Chip ESD Failures • Device Technology and FAOverview • Electrostatic Calculations for the ESD Engineer • TLP Systems Design and VeryFast TLP Applications • TLP Measurements: Parametric Analyzer for ESD On-Chip Protection Technical Sessions • 1A On-Chip RF • 2B Testing (TLP, On-Chip, Standards) • 3B System Level ESD Workshops • A.2 TLP Application for Design and Characterization: Can we use TLP in a different way? • B.2 System Level ESD Considerations Track 2 Factory, Materials, and ESD Control (FMEC) Targeted to those responsible for the fac- tory floor, standards, material selection, or ESD program management, this track offers sessions and activities specifically focused on the information and resources needed to address and solve ESD prob- lems. 27 th Annual EOS/ESD Symposium Anaheim, California, USA, September 11-16, 2005 In this issue Online seminar The next online seminar, Air Ionization, has been scheduled for June 6. See page 8 for more information. First Program Manager exam The ESD Association is offering the first Program Manager exam at the 2005 EOS/ ESD Symposium. See page 10 for details. Customize your symposium experience ............................. 1 Philippine Forum success ........ 2 From the President .................. 3 2005 Plenary session ............... 3 Symposium fees ...................... 4 Education schedule .................. 5 Device/Design Seminar ........... 6 Corporate membership ............ 7 Device/Design Seminar in Ger- many ..................................... 7 Online tutorials update.............. 8 Symposium schedule .............. 8 Notice to NARTE certified engi- neers ..................................... 8 Exhibit at symposium ............... 9 June meeting schedule .......... 10 First Program Manager exam 10 And the survey says ................ 11 Calendar ................................. 12