WG 5.0 – Device Testing

Status:
Active
Working Group Chair:
Brett Carn, Intel
  • Summary of meeting activities:

    The committee discussed the publication of ANSI/ESD SP5.0-2018. There are no updates currently needed. The group then briefly discussed work to advance inclusion of ESD in data sheets and inclusion of a requirement in ANSI/ESD S20.20. A decision was made for the group to go dormant as there are no current projects.

  • The group completed the five-year review of ANSI/ESD SP5.0. There was also a discussion on how die-to-die interfaces are handled regarding ESD targets and testing.

  • The WG addressed final TAS comments on WIP5.0 – “Reporting ESD Withstand Levels on Datasheets”. The document is ready for STDCOM submission.

  • The WG discussed possible updates to SP5.0 – “Reporting ESD Withstand Levels on Datasheets”.

    It was mentioned, that high voltage HBM stress is being performed on select pins on devices. A datasheet was shared, which showed how different HBM testing (levels) done on individual pin sets are reported differently. The question was, does ANSI/ESD SP5.0 need to be updated to include this information?

    Another question was asked, should HBM and CDM testing be performed on the same exact units (no ATE in between)?

    • General consensus was that latch-up testing cannot be done on units that were HBM/CDM testing.
    • HBM and CDM stress on the same exact units is still an open question.
    • Details on a product that had ESD field failures but passed HBM and CDM qualification levels were shared with the group.
    • Open discussion on exploring alternative stress methods to re-create the damage occurring in the field. The product was featured in a 2011 Symposium paper.
  • The WG adjudicated the industry review comments on DSP5.0-2023 - “Reporting ESD Withstand Levels on Datasheets”.

  • The committee held discussions on two important topics affecting both the HBM (Human Body Model) and CDM (Charged Device Model) Joint Working Groups (JWGs):

    • Consistency in unit usage for both HBM and CDM tests.
    • Implementing step-stressing of units with testing conducted only at the beginning and end.

    Statements addressing these topics were developed for use in both JS-001 (HBM) and JS-002 (CDM). A final draft of these statements will be finalized on a virtual call before June.

  • A consensus was reached on adjusting language regarding the interchangeability of CDM units for HBM testing and vice versa—identified text in JS-001 and JS-002 requiring modification or removal. The decision will be forwarded to both JWGs for integration into the upcoming JS-001 and JS-002 updates.

    Lengthy discussion on failure criteria in JS-001 and JS-002, exploring the feasibility of offering more guidance. Consideration of a Technical Report (TR) for additional direction, as no further information can be appended to JS-001 and JS-002.

  • Summary of discussions/activities/document reviews during the most recent WG meeting.

    • ATE testing only at the beginning/end of step stressing
      • During characterization, ATE may not be used, whereas it's required during qualification. Many use leakage measurements and it was suggested to add guidance in the User Guides for HBM and CDM.
      • Action Item: Brett will draft a proposal for WG5 review.
    • Use of curve tracing in place of ATE during characterization
      • Many use curve tracing during characterization, rather than ATE but there's limited information available on interpreting curve tracing.
      • WG decided information is needed and a TR should be developed on curve tracing. A writing team was identified.
        • Start as a TR and then discuss as to whether this would be folded into the individual User Guides.
      • Action item: Develop a TR highlighting when it’s useful, how to perform, how to avoid causing damage and how to interpret results – Brett to kick off the first call and identify owners.
    • Review of failure criteria within the JS-001 and JS-002 docs
      • Terms are different in the documents and don't really cover all scenarios.
      • WG spent time in the meeting to modify the failure criteria – after the final WG review, this will be used in both JS-001 and JS-002.
      • Action item: Brett to send out the suggested change options for the failure criteria for WG vote.
  • Summary of meeting activities:

    The working group discussed ways to consider sharing information on CDM between the supplier and manufacturer. The group also explored possible new activities for the WG including a guide to help understand all the various device specifications. Will be discussed further at the September face-to-face meeting.

  • Summary of meeting activities:

    The WG reviewed the status of ANSI/ESD SP5.0 and discussed the connection to other documents as well as actual data sheets.

  • Summary of meeting activities:

    The working group adjudicated STDCOM vote comments on ESD WIP5.0-2018. The document will be submitted for industry review before the winter virtual meeting series.

  • Summary of meeting activities:

    The working group completed follow-up adjudication of TAS comments on ESD WIP5.0-2018. The document will be submitted for STDCOM VBM before the September meeting series. There was a discussion on ways to promote inclusion of ESD data on manufacturers’ data sheets.

  • Summary of meeting activities:

    The working group completed adjudication of TAS comments on ESD WIP5.0-2018. There was a discussion on ESD data terminology concerns and a need for some new test procedure options for consideration by the HBM and CDM joint working groups.

  • Summary of meeting activities:

    The group adjudicated technical and advisory support committee comments on ESD WIP5.0; a new standard practice for standardizing the format for ESD information on device data sheets.

  • Summary of meeting activities:

    The committee continued reviewing the current work in progress document on device ESD data sheet standard format. The document is expected to be submitted to the Technical and Administrative Support committee before the end of the year.

  • Summary of meeting activities:

    The committee reviewed and made suggested changes to the current work in progress document on device ESD data sheet standard format. A decision was made to submit the document as a standard practice instead of a technical report.

  • Summary of meeting activities:

    The committee held technical discussions on a new technical report related to reporting HBM and CDM results on a data sheet.  A number of significant changes were proposed and agreed to by the working group. The committee also discussed a future technical report related to datasheet guidance as well as the inclusion of system level ESD, HMM, and latch-up.

     

     

  • Summary of meeting activities:

    The committee reviewed a draft of the new technical report for an ESD data sheet template. A suggestion was made to include static latch-up information; discussion was held and a decision was made that static latch-up is outside the scope of the committee and the suggestion would be referred to the JEDEC 78 committee.

  • Summary of meeting activities:

    The working group reviewed the first draft of the “complete” Data Sheet on Handling (HBM/CDM) section in the new technical report. There was good discussion on different viewpoints of how data sheets are used. A discussion on possible “system-relevant” component information was transferred to WG 5.6 - HMM for further exploration.

  • Summary of meeting activities:

    An introduction to WG5.0 along with a review of past work / work in progress was presented for those new to the WG and guests. The committee then discussed sections of a document for a data sheet on handling (HBM/CDM); the document is ready for the writing team to begin. JEDEC has expressed interest in this being a joint document. The working group discussed a section on “system-level” information; however, more discussion is still needed. The possibility of a test method for surge protection devices was also discussed.

     

  • Summary of meeting activities:

    The committee continued working on a technical report for standardizing ESD information for component data sheets with a focus on handling (HBM and CDM) and systems (IEC, etc.). A discussion was held regarding other organizations where the data sheet template and technical report (TR) could be promoted and socialized once it is published.