ANSI/ESDA/JEDEC JS-002-2022
IEC 60749-28 is technically equivalent to ANSI/ESDA/JEDEC JS-002.
ANSI/ESDA/JEDEC JS-002-2022 (revision of ANSI/ESDA/JEDEC JS-002-2018)
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing – Charged Device Model (CDM) – Device Level
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin-film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. The devices shall be assembled into a package similar to that expected in the final application to perform the tests. This CDM document does not apply to socketed discharge model testers.
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