Certified Professionals

  • Device Stress Testing

    Christopher Irvine

    Qorvo
    Certified 2024
  • Professional Program Manager Certification

    Christopher Long

    (Instructor)
    IBM
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    Christopher Long is a senior engineer in the IBM Research Division, with over 26 years experience in semiconductor manufacturing. He currently has been involved in development of magneto-resistive random access memory (MRAM) products. Previous to this assignment, he had responsibility in the area of contamination and ESD control program strategy at IBM 200 & 300mm semiconductor manufacturing facilities. Mr. Long has published numerous papers on semiconductor manufacturing defect reduction and yield modeling, and has served as U.S. chair of the International Technology Roadmap for Semiconductors (ITRS) Yield Enhancement technology working group, responsible for development of the Yield Enhancement chapters of the 2001 and 2003 ITRS. Mr. Long received a B.S. in Physics from Beloit College, Beloit, WI (1980), and an M.S. in Engineering from the Thayer School of Engineering, Dartmouth College (1990), Hanover, NH. cwlong@us.ibm.com

     

    Credential ID: https://esdcertification.esda.org/en/c/1670f85675bd4b42b51c0c99cfbddcd4

     

  • TR53®-2018 Certified

    Christopher Nickels

    L-3 Insight Technology
  • Professional Program Manager Certification

    Christopher Smith

    Kimball Electronics
    Certified 2023
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    Christopher Smith works in ESD control and general quality auditing at Kimball Electronics Jasper. He was born in Indiana and grew up with a love of technology that led him to a career in manufacturing. He spends most of his spare time building and modifying his own PC at home, as well as finding new ways to entertain his cat. He’d like to travel to Ireland someday, time permitting. He has a bachelor’s from Ball State University in Telecommunications with an emphasis on Screenwriting and Video Editing, and has used this knowledge to assist with many corporate videography projects in addition to in-house training programs. He hopes to utilize those skills to create new educational ESD tools to help control static in the workplace. He has successfully co-led KEJ’s transition to ANSI S20.20 certification 5 years in a row.

     

    Credential ID: https://esdcertification.esda.org/en/c/c7d29d3e482d4631adedef2a6ed14e4b

     

  • Professional Program Manager Certification

    Chuck McClain

    Micron Technology Inc.
    Certified 2015
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    Chuck is an ESD Engineer at Micron Technology Inc. and ESD Coordinator for Micron’s Boise Idaho Facility. He is a founding member of Micron’s Corporate ESD steering team which maintains Micron’s ESD Specifications. Chuck is the aco-chair for SEMI ESD. He is also a member of several ESDA working groups.

    Interests outside of work include, hunting, fishing, hiking, Scottish Highland Games, and veteran outreach activities.

     

    Credential ID: https://esdcertification.esda.org/en/c/90b4213cb17642b9bd33452a384f1a3e

     

  • ESD Control Program Auditor Certification

    Chuck McClain

    Botron
    Certified 2024
  • ESDA Certified Professional Instructor Certification

    Chuck McClain

    Botron
    Certified 2024
  • Device Stress Testing

    Chun Bae Lim

    LG Display
    Certified 2018
  • TR53®-2018 Certified

    Chun-Chieh Lu

    Innolux Corporation
  • TR53®-2018 Certified

    Chun-Ming Chen

    tsmc Ltd.
  • Professional Program Manager Certification

    Chung Hooi (Alson) kow

    Tako Astatic Technology Sdn Bhd
    Certified 2019
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    Credential ID: 2d23083a54bb4817883f8a7ee3efabe1

  • ESD Design Engineer Certification 2 (EDEC2)

    Chung-Ti Hsu

    Qualcomm
    Certified 2026
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    Chung‑Ti Hsu received the B.S. and M.S. degrees in electronics engineering from National Chiao Tung University (NCTU), Hsinchu, Taiwan, in 2001 and 2003, respectively, and the Ph.D. degree in electrical and computer engineering from Northeastern University, Boston, MA, USA, in 2014.

    From 2003 to 2008, he was with Winbond Electronics Corporation, Hsinchu, Taiwan, working on electrostatic discharge (ESD) and latch‑up protection design and failure analysis for logic, analog, RF, LCD driver, DRAM, and Flash memory ICs. In 2008, he joined Nuvoton Technology Corporation as a Technology Assistant Manager, leading the development of latch‑up‑free ESD protection designs in Bipolar/CMOS/DMOS (BCD) technologies for smart power applications.

    Since 2014, he has been with Qualcomm Technologies, Inc., where he is currently a Senior Staff Engineer. His work focuses on ESD and latch‑up protection architecture, design sign‑off, and silicon validation for PMIC, fingerprint, envelope‑tracking, and mixed‑signal products. He has designed and co‑designed ESD protection solutions for more than 100 production ICs.

    Outside of his professional work, he enjoys reading, basketball, running, and playing Go—long regarded as the last board game to resist computers until March 15, 2016. Since April 2023, he has focused on distance running, achieving a personal best of 1:44:14 in the half marathon, and is currently training for his first full marathon

    Credential ID: 3e1b7ba817bc45ffbb76638f16428dba

  • TR53®-2018 Certified

    Clayton Dell

    Attabotics Inc
    Certified 2021
  • Compliance Verification Technician to TR53®

    Cody Deas

    Bruker Spatial Biology
    Certified 2025
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  • Professional Program Manager Certification

    Colin Banks

    Kyocera International Inc.
    Certified 2022
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    Colin Banks is a Quality Engineer at Kyocera International Inc. for their Assembly Technology Division. He specializes in the wirebonding process, but is also involved in various flip chip products. His duties include failure / root cause analysis and corrective actions as well as process improvement using lean / six sigma methodology.

    Academically, Colin has earned his BS in Mechanical Engineering from San Diego State University and a Lean Six Sigma Certificate from San Diego City College.

    Outside of work Colin enjoys building and racing cars, as well as analog photography.

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