IEC 60749-28:2022
IEC 60749-28:2022 is technically equivalent to ANSI/ESDA/JEDEC JS-002.
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
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Hard copy Document Bundle: ANSI/ESDA/JEDEC JS-002 with IEC 60749-28
Electronic Document Bundle: ANSI/ESDA/JEDEC JS-002 with IEC 60749-28
All electronic documents must be delivered directly to the intended person for use on only one computer. The document may not be forwarded to any additional users or accessed on multiple computers. Electronic documents will be emailed within 48 business hours.